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Local Structure Characterization in Nanomaterials using Aberration Corrected STEM
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1182-1183
- Print publication:
- August 2007
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Microscopic and Theoretical Investigations of the Si-SiO2 Interface
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- Journal:
- MRS Online Proceedings Library Archive / Volume 592 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 15
- Print publication:
- 1999
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- Article
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