14 results
Nanocrystalline Solar Cell Materials Characterization
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1430-1431
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- July 2009
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Direct Methanol Fuel Cell Materials Characterization
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1432-1433
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- July 2009
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FIB/SEM Fabrication of Nanostructures for Plasmonic Sensors and Waveguides
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 354-355
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- July 2009
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Development of a Micro Mass Spectrometer: Analysis of Particle Behavior in MEMS Ion Lens Systems
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 242-243
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- July 2009
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Applications of Scanned Probe Microscopy in Physical Sciences
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 94-95
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- August 2008
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OmniGIS Gas Injection System for Ion Beam Induced Deposition and Etching
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1028-1029
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- August 2008
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AFM Learning Activities for a 7-11 Grade Nanotechnology Course
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 860-861
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- August 2008
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FIB Fabrication of Metallic Nanostructures on End-faces of Cleaved Optical Fibers for Chemical Sensing Applications
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 988-989
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- August 2008
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A Wide Range of FIB Applications in a Multidisciplinary Analytical Facility
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 1328-1329
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- August 2006
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Focused Ion Beam Based Micromanipulation to Form Air Bridge Interconnect
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1278-1279
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- August 2006
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Monitoring Contamination Rate in an SEM Equipped with an Evactron Anti-Contamination Device
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 204-205
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- August 2006
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Combined SEM Electron-Beam-Induced Current and Cathodoluminescence Imaging and STEM Structural Analysis of GaN Light Emitting Diodes
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1514-1515
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- August 2006
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Application of an Improved Mathematical Model to the Analysis of Cross-Sectional EBIC of GaN-Based LEDs
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 752-753
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- August 2006
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Effects of Beam and Scan Parameters on 3-Dimensional Carbon Structure Growth Using Electron Beam Induced Chemistry
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1284-1285
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- August 2006
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