5 results
Structural and Elemental Analysis of Heavily- Doped ZnO
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 392-393
- Print publication:
- July 2012
-
- Article
- Export citation
Absence of Lateral Composition Fluctuations in Aberration-corrected STEM Images of an InGaN Quantum Well at Low Dose
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 1432 / 2012
- Published online by Cambridge University Press:
- 16 May 2012, mrss12-1432-g04-03
- Print publication:
- 2012
-
- Article
- Export citation
Indium Composition Variation in Nominally Uniform InGaN Layers Discovered by Aberration-Corrected Z-contrast STEM
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1386-1387
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
Effect of Growth Conditions on Electronic and Structural Properties of GZO Films Grown by Plasma-enhanced Molecular Beam Epitaxy on p-GaN(0001)/Sapphire Templates
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 1315 / 2011
- Published online by Cambridge University Press:
- 04 April 2011, mrsf10-1315-mm09-03
- Print publication:
- 2011
-
- Article
- Export citation
Visible Luminescence Related to Defects in ZnO
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 1035 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 1035-L03-05
- Print publication:
- 2007
-
- Article
- Export citation