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Coupling Electronic Holography and Finite-Element Method Simulations to Measure Electric Fields in Nanocapacitors.
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2278-2280
- Print publication:
- August 2022
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Three Dimensional Visualization of Electromagnetic Fields from One Dimensional Nanostructures
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1977-1978
- Print publication:
- August 2015
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Observing and measuring strain in nanostructures and devices with transmission electron microscopy
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- Journal:
- MRS Bulletin / Volume 39 / Issue 2 / February 2014
- Published online by Cambridge University Press:
- 12 February 2014, pp. 138-146
- Print publication:
- February 2014
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