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Correlative t-EBSD Tomography and Atom Probe Tomography Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 682-683
- Print publication:
- July 2016
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Characterizing Local Misorientation Gradients Near Grain Boundaries
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 712-713
- Print publication:
- August 2013
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The Effects of EBSD Collection Speed on Indexing Accuracy
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 19 July 2003, pp. 722-723
- Print publication:
- August 2003
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Observation of Grain Growth in Cu Films by In-Situ EBSD Analysis
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- Journal:
- MRS Online Proceedings Library Archive / Volume 766 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, E4.5
- Print publication:
- 2003
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Chemistry Assisted Phase Differentiation in Automated Electron Backscatter Diffraction
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 682-683
- Print publication:
- August 2002
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