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Quantification of Trace-Level Silicon Doping in AlxGa1–xN Films Using Wavelength-Dispersive X-Ray Microanalysis
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue 4 / August 2021
- Published online by Cambridge University Press:
- 05 July 2021, pp. 696-704
- Print publication:
- August 2021
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You Do What in Your Microprobe?! The EPMA as a Multimode Platform for Nitride Semiconductor Characterization
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 2026-2027
- Print publication:
- August 2018
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