6 results
Direct Measurement of Inhomogeneous Longitudinal Dopant Distribution in SiNWs Using Nano-Probe Scanning Auger Microscopy.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1349 / 2011
- Published online by Cambridge University Press:
- 20 September 2011, mrss11-1349-dd08-05
- Print publication:
- 2011
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3D Complete-Tilt Electron Tomography of Semiconductor Nanowires
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1876-1877
- Print publication:
- July 2010
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- Article
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Atom-Probe Tomography of Semiconductor Materials and Device Structures
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- Journal:
- MRS Bulletin / Volume 34 / Issue 10 / October 2009
- Published online by Cambridge University Press:
- 02 March 2012, pp. 738-743
- Print publication:
- October 2009
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Single Crystal Silicon Carbide On Silicon Using A Supersonic Gas Jet Of Methylsilane
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- Journal:
- MRS Online Proceedings Library Archive / Volume 483 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 279
- Print publication:
- 1997
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Single Crystal Wurtzitic Aluminum Nitride Growth on Silicon Using Supersonic Gas Jets
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- Journal:
- MRS Online Proceedings Library Archive / Volume 395 / 1995
- Published online by Cambridge University Press:
- 21 February 2011, 319
- Print publication:
- 1995
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Supersonic Jet Epitaxy: An Improved Method for Nitride Deposition
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- Journal:
- MRS Online Proceedings Library Archive / Volume 395 / 1995
- Published online by Cambridge University Press:
- 21 February 2011, 301
- Print publication:
- 1995
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