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e-Beam Detection of Buried Open Defects in Semiconductor Device
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2254-2255
- Print publication:
- August 2019
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Grain Boundary Curvature in Polycrystalline Metallic Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 615 / 2000
- Published online by Cambridge University Press:
- 14 March 2011, G7.8.1
- Print publication:
- 2000
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Triple Junction Engineering: the Distribution of Triple Junctions in Polycrystalline Gold Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 586 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 117
- Print publication:
- 1999
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Tem Study of Yielding in Polycrystalline Gold Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 505 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 383
- Print publication:
- 1997
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