4 results
Structural characterization of 3C-SiC films grown on Si layers wafer bonded to polycrystalline SiC substrates
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 815 / 2004
- Published online by Cambridge University Press:
- 15 March 2011, J5.23
- Print publication:
- 2004
-
- Article
- Export citation
Interference-enhanced Raman Scattering in Strain Characterization of Ultra-thin Strained SiGe and Si Films on Insulator
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 809 / 2004
- Published online by Cambridge University Press:
- 17 March 2011, B3.6
- Print publication:
- 2004
-
- Article
- Export citation
Relaxed SiGe Layers with High Ge Content by Compliant Substrates
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 768 / 2003
- Published online by Cambridge University Press:
- 02 August 2011, G1.7/D4.7
- Print publication:
- 2003
-
- Article
- Export citation
Relaxed SiGe Layers with High Ge Content by Compliant Substrates
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 765 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, D4.7/G1.7
- Print publication:
- 2003
-
- Article
- Export citation