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Optimized FIB Sample Preparation for Atomic Resolution Analytical STEM at Low kV - A Key Requirement for Successful Application
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 630-631
- Print publication:
- July 2011
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- Article
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