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In situ Characterization of Exposed E-Beam Resist Using Novel AFM Technique
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 476-477
- Print publication:
- July 2010
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Charged Excitons in Self-assembled Quantum Dots
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- Journal:
- MRS Online Proceedings Library Archive / Volume 737 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, E12
- Print publication:
- 2002
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Kondo-excitons and Auger processes in self-assembled quantum dots
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- Journal:
- MRS Online Proceedings Library Archive / Volume 737 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, E12.5
- Print publication:
- 2002
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Epitaxial Superconductor Film Growth on Ultratffln Silicon Wafers for Infrared Detection
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- Journal:
- MRS Online Proceedings Library Archive / Volume 275 / 1992
- Published online by Cambridge University Press:
- 26 February 2011, 747
- Print publication:
- 1992
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