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Characterization of Failure Mechanisms and Failure Rate of Oxide Wearout by Hot Electron Using D.C. and A.C. Substrate Electron Injection
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- Journal:
- MRS Online Proceedings Library Archive / Volume 225 / 1991
- Published online by Cambridge University Press:
- 15 February 2011, 271
- Print publication:
- 1991
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- Article
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