5 results
Application of Lattice Strain Analysis of Semiconductor Device by Nano-beam Diffraction Using the 300 kV Cold-FE TEM
-
- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 114-115
- Print publication:
- July 2009
-
- Article
-
- You have access
- Export citation
Development of Automatic Magnification Calibration Function for Scanning Transmission Electron Microscope
-
- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 752-753
- Print publication:
- August 2005
-
- Article
-
- You have access
- Export citation
A Model of P/Tempel 2 With Dust and Detailed Chemistry
-
- Journal:
- Symposium - International Astronomical Union / Volume 150 / 1992
- Published online by Cambridge University Press:
- 07 August 2017, pp. 449-450
- Print publication:
- 1992
-
- Article
-
- You have access
- Export citation
Mass Loss Rates of Three Comets
-
- Journal:
- Symposium - International Astronomical Union / Volume 150 / 1992
- Published online by Cambridge University Press:
- 07 August 2017, pp. 447-448
- Print publication:
- 1992
-
- Article
-
- You have access
- Export citation
Modeling Dust Fragmentation in Comets
-
- Journal:
- International Astronomical Union Colloquium / Volume 126 / 1991
- Published online by Cambridge University Press:
- 12 April 2016, pp. 221-224
- Print publication:
- 1991
-
- Article
-
- You have access
- Export citation