68 results
A Remembrance of David C. Joy, a True Microscopy and Microanalysis Pioneer
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- Microscopy Today / Volume 30 / Issue 6 / November 2022
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- 24 November 2022, pp. 46-47
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- November 2022
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Energy-Dispersive X-Ray Spectrum Simulation with NIST DTSA-II: Comparing Simulated and Measured Electron-Excited Spectra
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- Microscopy and Microanalysis / Volume 28 / Issue 6 / December 2022
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- 02 September 2022, pp. 1905-1916
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- December 2022
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Energy Dispersive X-ray Spectrum Simulation with NIST DTSA-II: Comparing Simulated and Measured Electron-Excited Spectra
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 984-985
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- August 2022
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Quantitative Electron-Excited X-ray Microanalysis With Low-Energy L-shell X-ray Peaks Measured With Energy-Dispersive Spectrometry
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- Microscopy and Microanalysis / Volume 27 / Issue 6 / December 2021
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- 03 September 2021, pp. 1375-1408
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- December 2021
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Electron-Excited X-ray Microanalysis by Energy Dispersive Spectrometry at 50: Analytical Accuracy, Precision, Trace Sensitivity, and Quantitative Compositional Mapping
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- Microscopy and Microanalysis / Volume 25 / Issue 5 / October 2019
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- 23 August 2019, pp. 1075-1105
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- October 2019
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Using the EDS Clues: Peak Fitting Residual Spectrum and Analytical Total
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 446-447
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- August 2019
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Comprehensive Quantitative Elemental Microanalysis with Electron-Excited Energy Dispersive X-ray Spectrometry (EDS): 50 Years Young and Getting Better Every Day!
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 712-713
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- August 2018
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An Iterative Qualitative–Quantitative Sequential Analysis Strategy for Electron-Excited X-ray Microanalysis with Energy Dispersive Spectrometry: Finding the Unexpected Needles in the Peak Overlap Haystack
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- Microscopy and Microanalysis / Volume 24 / Issue 4 / August 2018
- Published online by Cambridge University Press:
- 03 September 2018, pp. 350-373
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- August 2018
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Uncertainty Propagation for Energy Dispersive X-ray Spectrometry
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 708-709
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- August 2018
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'High Resolution' Is Often Sought in SEM Imaging, But Establishing Visibility May Be the Challenge: Always Ask "What Might I Be Missing?"
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 608-609
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- August 2018
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Standard Bundles Simplify Standards-based Quantification in NIST DTSA-II
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 220-221
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- July 2017
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The “Great VPSEM Gotcha”: Great VPSEM Imaging Does Not Imply Great VPSEM X-ray Microanalysis! Degraded Spatial Resolution Is Always Imposed by Gas Scattering
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1090-1091
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- July 2017
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Microanalysis: What Is It, Where Did It Come From, and Where Is It Going?
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 2294-2295
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- July 2017
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Electron-Excited X-Ray Microanalysis at Low Beam Energy: Almost Always an Adventure!†
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- Microscopy and Microanalysis / Volume 22 / Issue 4 / August 2016
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- 12 August 2016, pp. 735-753
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- August 2016
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Quantitative Metrics for Classifying Candidate Gun-Shot Residue Particles
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 2048-2049
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- July 2016
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Uncertainty Is Our Friend-Rethinking Microanalysis Around Uncertainty Metrics
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 398-399
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- July 2016
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Rigorous Quantitative SEM/EDS Microanalysis Requires Careful Inspection of the Peak-Fitting Residual Spectrum to Reveal Hidden Constituents
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 396-397
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- July 2016
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Measurement of Trace Constituents by Electron-Excited X-Ray Microanalysis with Energy-Dispersive Spectrometry
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- Microscopy and Microanalysis / Volume 22 / Issue 3 / June 2016
- Published online by Cambridge University Press:
- 06 May 2016, pp. 520-535
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- June 2016
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Quantitative Electron-Excited X-Ray Microanalysis of Borides, Carbides, Nitrides, Oxides, and Fluorides with Scanning Electron Microscopy/Silicon Drift Detector Energy-Dispersive Spectrometry (SEM/SDD-EDS) and NIST DTSA-II
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- Microscopy and Microanalysis / Volume 21 / Issue 5 / October 2015
- Published online by Cambridge University Press:
- 14 September 2015, pp. 1327-1340
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- October 2015
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Quantitative Electron-Excited X-ray Microanalysis at Low Beam Energy
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1875-1876
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- August 2015
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