3 results
HAADF STEM and PL Characterization of Monolayer-Thick GaN/(Al,Ga)N Quantum Wells for Deep UV Optoelectronics Applications
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1488-1489
- Print publication:
- July 2017
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TEM Analysis of Defects in AlGaN Heterostructures Grown on C-AI2O3 by Plasma Assisted Molecular Beam Epitaxy
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1803-1804
- Print publication:
- August 2015
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Fine Structural Studies of AlGaN Laser Heterostructures with Digitally Alloyed Quantum Wells Grown on c-Al2O3 by plasma-Assisted Molecular Beam Epitaxy
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 80-81
- Print publication:
- August 2014
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