5 results
A Closer “Look” at Modern Gate Oxides
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 611 / 2000
- Published online by Cambridge University Press:
- 14 March 2011, C4.1.1
- Print publication:
- 2000
-
- Article
- Export citation
Rutherford Backscattering (RBS) and Channeling Studies of Defects in Arsenic Implanted Silicon Induced by Arsenic Clustering
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 82 / 1986
- Published online by Cambridge University Press:
- 26 February 2011, 115
- Print publication:
- 1986
-
- Article
- Export citation
Origin of Subboundary Formation in Encapsulated Recrystallized Si Films on SiO2
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 74 / 1986
- Published online by Cambridge University Press:
- 28 February 2011, 571
- Print publication:
- 1986
-
- Article
- Export citation
Metastable Activation in Rapid Thermal Annealed Arsenic Implanted Silicon
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 52 / 1985
- Published online by Cambridge University Press:
- 26 February 2011, 23
- Print publication:
- 1985
-
- Article
- Export citation
Linear Zone-Melt Recrystallized Si Films Using Incoherent Light
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 13 / 1982
- Published online by Cambridge University Press:
- 15 February 2011, 569
- Print publication:
- 1982
-
- Article
- Export citation