2 results
The Gettering and Electrical Activity of Ni, Au, and Cu in Epitaxial Si/Si(2%Ge)/Si during RTA
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- Journal:
- MRS Online Proceedings Library Archive / Volume 224 / 1991
- Published online by Cambridge University Press:
- 28 February 2011, 55
- Print publication:
- 1991
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- Article
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Temperature Dependent Recombination Lifetime in Silicon: Influence of Trap Level
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- Journal:
- MRS Online Proceedings Library Archive / Volume 209 / 1990
- Published online by Cambridge University Press:
- 26 February 2011, 567
- Print publication:
- 1990
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- Article
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