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Direct Measurement of the CCD with a Subpixel Resolution by Using a New Technique

Published online by Cambridge University Press:  25 May 2016

K. Yoshita ,
S. Kitamoto ,
E. Miyata ,
H. Tsunemi  and
K. C. Gendreau
K. Yoshita
Affiliation:
Graduate School of Science, Osaka University 1-1 Machikaneyama-cho, Toyonaka, Osaka 560, Japan
S. Kitamoto
Affiliation:
Graduate School of Science, Osaka University 1-1 Machikaneyama-cho, Toyonaka, Osaka 560, Japan
E. Miyata
Affiliation:
Graduate School of Science, Osaka University 1-1 Machikaneyama-cho, Toyonaka, Osaka 560, Japan
H. Tsunemi
Affiliation:
Graduate School of Science, Osaka University 1-1 Machikaneyama-cho, Toyonaka, Osaka 560, Japan
K. C. Gendreau
Affiliation:
Goddard Space Flight Center

Extract

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The response function of the front-illuminated CCD, like SIS on ASCA, can be devided into three parts: the gate structure transmission, the absorption efficiency in the depletion region and the charge spreading after the photo-absorption. These effect depend on both the incident X-ray energy and the landing posion of the X-ray inside the CCD pixel. Then, the measurement of the X-ray efficiency within the pixel is important for the response function of the CCD. By using a new technique, we performed an experiment using the SIS CCD chip in the GSFC in order to measure how the various types of events are formed.

Type
Session 2: Future Space Programs
Information
Symposium - International Astronomical Union , Volume 188: The Hot Universe , 1998 , pp. 339 - 340
Copyright
Copyright © Kluwer 1998