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S96 Residual Stress Measurements by X-ray Diffraction: Critical Evaluation of Error Sources

Published online by Cambridge University Press:  20 May 2016

R. Machado ,
A. Kuznetsov ,
C. A. Achete  and
T. Hirsch
R. Machado
Affiliation:
Divisão de Metrologia de Materiais, INMETRO, RJ, Brasil
A. Kuznetsov
Affiliation:
Divisão de Metrologia de Materiais, INMETRO, RJ, Brasil
C. A. Achete
Affiliation:
Divisão de Metrologia de Materiais, INMETRO, RJ, Brasil
T. Hirsch
Affiliation:
Institut fuer Werkstoffechnik, Bremen, Germany
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Abstract

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Type
DENVER X-RAY CONFERENCE
Information
Powder Diffraction , Volume 23 , Issue 2 , June 2008 , pp. 182
Copyright
Copyright © Cambridge University Press 2008

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