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S79 Invited—Industrial Challenges for Residual Stress XRD Applications

Published online by Cambridge University Press:  20 May 2016

A. Haase ,
R. Stabenow  and
A. Schafmeister
A. Haase
Affiliation:
GE Inspection Technologies, Ahrensburg, Germany
R. Stabenow
Affiliation:
GE Inspection Technologies, Ahrensburg, Germany
A. Schafmeister
Affiliation:
GE Inspection Technologies, Ahrensburg, Germany
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Abstract

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Type
DENVER X-RAY CONFERENCE
Information
Powder Diffraction , Volume 23 , Issue 2 , June 2008 , pp. 182
Copyright
Copyright © Cambridge University Press 2008

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