Hostname: page-component-cd9895bd7-p9bg8 Total loading time: 0 Render date: 2024-12-29T17:36:43.602Z Has data issue: false hasContentIssue false
  • English
  • Français

S41 Application of X-ray Diffraction Stress Analysis at Constant Penetration Depth for the Determination of Both Real-Space Residual-Stress and Lattice-Parameter Gradients

Published online by Cambridge University Press:  20 May 2016

M. Wohlschlögel ,
U. Welzel  and
E. J. Mittemeijer
M. Wohlschlögel
Affiliation:
Max Planck Institute for Metals Research, Stuttgart, Germany
U. Welzel
Affiliation:
Max Planck Institute for Metals Research, Stuttgart, Germany
E. J. Mittemeijer
Affiliation:
Max Planck Institute for Metals Research, Stuttgart, Germany
Get access Rights & Permissions [Opens in a new window]

Abstract

An abstract is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
DENVER X-RAY CONFERENCE
Information
Powder Diffraction , Volume 23 , Issue 2 , June 2008 , pp. 182
Copyright
Copyright © Cambridge University Press 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)