Hostname: page-component-cd9895bd7-7cvxr Total loading time: 0 Render date: 2024-12-29T18:17:36.010Z Has data issue: false hasContentIssue false

S186 Invited—X-ray Microdiffraction Techniques for Measuring Local Microstructure and Strain Distributions

Published online by Cambridge University Press:  20 May 2016

J. D. Budai
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
B. C. Larson
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
G. E. Ice
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
J. Z. Tischler
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
T. Z. Ward
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
W. Liu
Affiliation:
Argonne National Laboratory, Argonne, IL
D. D. Sarma
Affiliation:
Indian Inst. of Science, Bangalore, India

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
DENVER X-RAY CONFERENCE
Copyright
Copyright © Cambridge University Press 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)