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F-15 Improving Trace Element Detection in EDXRF by Reducing Pileup Artifacts

Published online by Cambridge University Press:  20 May 2016

W. T. Elam
Affiliation:
EDAX, Inc., Mahwah, NJ
B. Scruggs
Affiliation:
EDAX, Inc., Mahwah, NJ
M. Solazzi
Affiliation:
EDAX, Inc., Mahwah, NJ
J. Nicolosi
Affiliation:
EDAX, Inc., Mahwah, NJ

Abstract

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Type
DENVER X-RAY CONFERENCE
Copyright
Copyright © Cambridge University Press 2008

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