Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-03T05:12:41.189Z Has data issue: false hasContentIssue false
  • English
  • Français

D085 Synchrotron X-ray Study of Structural Phase Transformations in Continuous and Patterned Ge2Sb2Te5 Phase-Change Material Thin Films

Published online by Cambridge University Press:  20 May 2016

J.L. Jordan-Sweet ,
S.M. Rossnagel ,
P.M. Mooney ,
S. Raoux  and
C.T. Rettner
J.L. Jordan-Sweet
Affiliation:
IBM T.J. Watson Research Center, Yorktown Heights, NY
S.M. Rossnagel
Affiliation:
IBM T.J. Watson Research Center, Yorktown Heights, NY
P.M. Mooney
Affiliation:
IBM T.J. Watson Research Center, Yorktown Heights, NY
S. Raoux
Affiliation:
IBM Almaden Research Center, San Jose, CA
C.T. Rettner
Affiliation:
IBM Almaden Research Center, San Jose, CA
Get access Rights & Permissions [Opens in a new window]

Abstract

An abstract is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 20 , Issue 2 , June 2005 , pp. 174
Copyright
Copyright © Cambridge University Press 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)