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D058 Determination of local strain field in SOI lines using high resolution X-ray diffraction

Published online by Cambridge University Press:  20 May 2016

A. Loubens ,
M. Gailhanou ,
O. Thomas ,
J.-S. Micha ,
R. Fortunier  and
B. Charlet
A. Loubens
Affiliation:
Université Paul Cézanne, Marseille, France Ecole Nationale Supérieure des Mines de Saint-Etienne, Gardanne, France
M. Gailhanou
Affiliation:
Université Paul Cézanne, Marseille, France
O. Thomas
Affiliation:
Université Paul Cézanne, Marseille, France
J.-S. Micha
Affiliation:
CEA-Grenoble/DRFMC/SI3M/PCM, Grenoble, France
R. Fortunier
Affiliation:
Ecole Nationale Supérieure des Mines de Saint-Etienne, Gardanne, France
B. Charlet
Affiliation:
CEA Leti, Grenoble, France
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 21 , Issue 2 , June 2006 , pp. 184
Copyright
Copyright © Cambridge University Press 2006

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