Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-28T10:05:11.550Z Has data issue: false hasContentIssue false
  • English
  • Français

D043 Phase Identification and Sequence Characterization in Ni-Si Thin Films at Low Temperature

Published online by Cambridge University Press:  20 May 2016

C. Coia ,
P. Desjardins ,
C. Lavoie  and
C. Detavernier
C. Coia
Affiliation:
École Polytechnique de Montréal, Montréal, Canada
P. Desjardins
Affiliation:
École Polytechnique de Montréal, Montréal, Canada
C. Lavoie
Affiliation:
IBM, T.J. Watson Research Center, Yorktown Heights, NY
C. Detavernier
Affiliation:
IBM, T.J. Watson Research Center, Yorktown Heights, NY
Get access Rights & Permissions [Opens in a new window]

Abstract

An abstract is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 18 , Issue 2 , June 2003 , pp. 175
Copyright
Copyright © Cambridge University Press 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)