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Three-dimensional tomography of single charge inside dielectric materials using electrostatic force microscopy
Published online by Cambridge University Press: 12 January 2012
Abstract
In this contribution, we report on a numerical study demonstrating how to realize Electrostatic Force Microscopy (EFM) tomography. Based on the Equivalent Charge Method, both force and force gradient between a buried object (or trapped charges) and the Atomic Force Microscope tip are calculated. The main idea is to scan the sample at different tip sample distances and obtain the position and charge value of the object using reconstruction algorithms. The quantitative analysis here presented is a first step toward tomography for samples presenting “dilute” point charges creating non correlated signals by the interpretation of EFM signals. Lateral resolution, sensitivity (i.e. ability to detect an object), performance and limitations of EFM are also discussed in the paper.
- Type
- Research Article
- Information
- MRS Online Proceedings Library (OPL) , Volume 1421: Symposium PP – Three-Dimensional Tomography of Materials , 2012 , mrsf11-1421-pp05-09
- Copyright
- Copyright © Materials Research Society 2012
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