Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-24T19:36:40.637Z Has data issue: false hasContentIssue false

Thickness Dependent Optical Properties of WO3 Thin Film using Surface Plasmon Resonance

Published online by Cambridge University Press:  12 February 2013

Ayushi Paliwal
Affiliation:
Department of Physics and Astrophysics, University of Delhi, Delhi 110007, INDIA
Monika Tomar
Affiliation:
Department of Physics, Miranda House, University of Delhi, Delhi 110007, INDIA
Vinay Gupta*
Affiliation:
Department of Physics and Astrophysics, University of Delhi, Delhi 110007, INDIA
*
*Email id:[email protected]; [email protected]Contact no: +91 9811563101
Get access

Abstract

The effect of tungsten oxide (WO3) thin film thickness on the surface plasmon resonance (SPR) properties have been investigated. WO3 films of varying the thickness (36 nm, 60 nm, 80 nm, 100 nm, 150 nm and 200nm) have been deposited onto Au coated prism (Au/prism) by radio frequency (RF) magnetron sputtering technique. The SPR responses of bilayer films were fitted with the Fresnel’s equations in order to calculate the dielectric constant of WO3 thin film. The variation of complex dielectric constant and refractive index with the thickness of WO3 thin film was studied.

Type
Articles
Copyright
Copyright © Materials Research Society 2013 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Yuan, X.C., Hong, B., Tan, Y.G., Zhang, D.W., Irawan, R., and Tjin, S.C., J. Opt. A: Pure Appl. Opt. 8, 959963 (2006).CrossRefGoogle Scholar
Yang, D., Lu, H.H., Chen, B., and Lin, C.W., Sensors and Actuators B 145, 832838 (2010).CrossRefGoogle Scholar
Bao, Z., Jiang, G.L.D., Cheng, W., and Ma, X., Materials Science and Engineering B 171, 155158 (2010).CrossRefGoogle Scholar
Acosta, M., González, D., and Riech, I., Thin Solid Films 517, 54425445 (2009).CrossRefGoogle Scholar
Yamada, Y., Tabata, K., and Yashima, T., Solar Energy Materials and Solar Cells 91, 2937 (2007).CrossRefGoogle Scholar
Hutchins, M. G., Abu-Alkhair, O., El-Nahass, M.M., and Abd El-Hady, K., Materials Chemistry and Physics 98, 401405 (2006).CrossRefGoogle Scholar
Bao, M., Li, G., Jiang, D., Cheng, W., and Ma, X., Materials Science and Engineering B 171, 155158 (2010).CrossRefGoogle Scholar
Raether, H., “Surface Plasmons on smooth and rough surfaces and on Gratings”, Springer Verlag, Berlin Hiedelberg, Tokyo.Google Scholar
Özdemir, S. K., and Turhan-Sayan, G., J. Lightwave Technol. 21, 805814 (2003).CrossRefGoogle Scholar
Mehan, N., Gupta, V., Sreenivas, K., and Mansingh, A., J. Appl. Phys. 96, 3134 (2004).CrossRefGoogle Scholar
Deng, H., Yang, D., Chen, B., and Lin, C.W., Sensors and Actuators B 134, 502509 (2008).CrossRefGoogle Scholar