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Tem Study of Cvd‐Grown Bi‐Sr‐Ca‐Cu‐0 Thin Films on (001) Mgo Substrates

Published online by Cambridge University Press:  28 February 2011

O. Ueda
Affiliation:
Fujitsu Laboratories Ltd., 10‐1 Morinosato‐Wakamiya, Atsugi 243‐01, JAPAN
T. Kimura
Affiliation:
Fujitsu Laboratories Ltd., 10‐1 Morinosato‐Wakamiya, Atsugi 243‐01, JAPAN
H. Yamawaki
Affiliation:
Fujitsu Laboratories Ltd., 10‐1 Morinosato‐Wakamiya, Atsugi 243‐01, JAPAN
M. Ihara
Affiliation:
Fujitsu Laboratories Ltd., 10‐1 Morinosato‐Wakamiya, Atsugi 243‐01, JAPAN
M. Ozeki
Affiliation:
Fujitsu Laboratories Ltd., 10‐1 Morinosato‐Wakamiya, Atsugi 243‐01, JAPAN
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Abstract

CVD‐grown Bi‐Sr‐Ca‐Cu‐0 thin films on (OOl)MgO with T at 110 K have been investigated by transmission electron microscopy. The films are found to consist of large domains oriented along the c‐axis, with diameters of 15‐100 um. These domains exhibit incommensurate superstructures along the fa‐axis. In addition, we have observed similar superstructure spots in two equivalent directions normal to each other. It has also been found that the interface between the thin film and the substrate is very abrupt. Five different perovskite‐related layers along the c‐axis with different thickness are present. In the thin film, 80K phases are dominant and 110 K phases are less likely. Three other phases are very rarely observed. Furthermore, boundaries where the layered structure is different on both sides are often found.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

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