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Structure Of Ceria Overlayer On Zirconia Crystal Studied by Surface Diffraction

Published online by Cambridge University Press:  15 February 2011

W. Dmowski ,
S. Fu ,
T. Egami ,
R. Gorte  and
J. Vhos
W. Dmowski
Affiliation:
Department of Materials and Engineering and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104–6272
S. Fu
Affiliation:
Department of Materials and Engineering and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104–6272
T. Egami
Affiliation:
Department of Materials and Engineering and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104–6272
R. Gorte
Affiliation:
Department of Chemical Engineering and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104–6272
J. Vhos
Affiliation:
Department of Chemical Engineering and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104–6272
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Abstract

We have utilized white x-ray beam and a Ge solid state detector, in energy dispersive mode, to study the diffraction from the surface layers of ceria deposited on (001) surface of Y stabilized cubic zirconia with grazing incident beam. We found that ceria forms islands, oriented epitaxially with respect to the zirconia substrate, with a lateral coherence of the order of 60 Å.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 401: Symposium G – Epitaxial Oxide Thin Films II , 1995 , 115
Copyright
Copyright © Materials Research Society 1996

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References

REFERENCES

1. Meriani, S., Mat. Sci. and Eng., A 109, p. 121 (1989).Google Scholar
2. Murota, T., Hasegawa, T., Aozasa, S., Matsui, H. and Motoyama, M., JALCOM, 193, p. 298 (1993).Google Scholar
3. Giessen, B.C. and Gordon, G.E., Science, 159, p 973 (1968)Google Scholar
4. Buras, B., Chwaszczewska, J., Szarras, S. and Szmid, Z., Rep. 894–11–PS, Inst. Nucl. Res. Warsaw (1968).Google Scholar
5. Dmowski, W., Egami, T., Gorte, R. and Vhos, J., to be published in Physica B.Google Scholar
6. Prober, J.M. and Schultz, J.M., J. Appl. Cryst., 8, p. 405 (1975).Google Scholar
7. Egami, T., J. Mater. Sci., 13, p. 2587 (1978).Google Scholar
8. Marra, W. C., Eisenberger, P., and Cho, A. Y., J. Appl. Phys., 50, p. 6927 (1979).Google Scholar
9. Feindenhans'l, R., Surface Science Reports, 10, p. 105 (1989); and references therein.Google Scholar
10. Robinson, I. K. and Tweet, D. J., Rep. Prog. Phys., 55, p. 599 (1992); and refrences therein.Google Scholar
11. Dosh, H., Int. J. of Modern Physics, B 6, p. 2773 (1992); and refrences thereinGoogle Scholar
12. Yoshimoto, M., Nagata, H., Tsukahara, T., and Koinuma, H., Jpn. J. Appl. Phys. 29, L1199 (1990).Google Scholar
13. Wu, X. D., Dye, R. C., Muenchausen, R. E., Foltyn, S. R., Maley, M., Rollett, A. D., Garcia, A. R., and Nogar, N. S., Appl. Phys. Lett., 58, p. 2165 (1991).Google Scholar