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Grazing Incidence X-Ray Scattering Study of Surface Defects
Published online by Cambridge University Press: 26 February 2011
Abstract
Grazing incidence x-ray scattering is emerging to become an important structural probe for surface and interface studies, especially in conjunction with the development of high brilliant synchrotron sources. In this paper, we give a brief review of the experimental principle and examples of how the technique can be applied to study surface defects.
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- Copyright © Materials Research Society 1987
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