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Frequency-Dependent Electromechanical Response in Ferroelectric Materials Measured via Piezoresponse Force Microscopy

Published online by Cambridge University Press:  01 February 2011

I. K. Bdikin ,
V. V. Shvartsman ,
S-H. Kim ,
J. Manuel Herrero  and
A. L. Kholkin
I. K. Bdikin
Affiliation:
Department of Ceramics and Glass Engineering/CICECO, University of Aveiro, 3810–193 Aveiro, Portugal
V. V. Shvartsman
Affiliation:
Department of Ceramics and Glass Engineering/CICECO, University of Aveiro, 3810–193 Aveiro, Portugal
S-H. Kim
Affiliation:
INOSTEK Inc., Gyeonggi Technopark, 1271–11 Sa 1, Sangnok, Ansan, Gyeonggi 425–791, Korea
J. Manuel Herrero
Affiliation:
Instituto de Ciencia de Materiales de Madrid, CSIC, Cantoblanco, 28049 Madrid, Spain
A. L. Kholkin
Affiliation:
Department of Ceramics and Glass Engineering/CICECO, University of Aveiro, 3810–193 Aveiro, Portugal
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Abstract

Local piezoelectric signal is measured via Piezoresponse Force Microscopy (PFM) in PbZr0.3Ti0.7O3 films and PbZr1/3Nb2/3O3-0.045PbTiO3 single crystals. It is observed that the amplitude of piezoelectric response is almost independent on frequency for vertical (out of plane) signal and strongly decreases with increasing frequency in the range 10–100 kHz for lateral (in-plane) response. Moreover, the in-plane piezoelectric contrast is reversed when the measurements are done at high enough frequency (phase shift exceeds 90°). As a result, the inplane polarization direction can be misinterpreted if the driving frequency exceeds certain level. For the explanation of observed effect a simple model is proposed that takes into account a possible slip between the conductive PFM tip and moving piezoelectric surface. The implications of the observed frequency-dependent contrast for the domain imaging in ferroelectric materials are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 784: Symposium C – Ferroelectric Thin Films XII , 2003 , C11.3
Copyright
Copyright © Materials Research Society 2004

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References

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