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Fracture-Exafs: A New Method for the Study of Interfaces in thin films and Polycrystalline Materials

Published online by Cambridge University Press:  16 February 2011

E. V. Barrera ,
Benji Maruyama  and
S. M. Heald
E. V. Barrera
Affiliation:
Division of Applied Physics, Department of Applied Science, Brookhaven National Laboratory, Upton, NY 11973
Benji Maruyama
Affiliation:
NRL-NRC Assoicate, Naval Research Laboratory, Washington, DC 20375-5000
S. M. Heald
Affiliation:
Division of Applied Physics, Department of Applied Science, Brookhaven National Laboratory, Upton, NY 11973
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Abstract

Fracture-EXAFS is a technique, proposed here for the first time, which combines an appropriate mechanical test with EXAFS analysis to investigate the atomic processes involved in the fracture process. Fracture-EXAFS builds upon the fracture-Auger electron spectroscopy technique, which was used to study the elemental composition of fracture surfaces, and has yielded significant insight into phenomena such as grain boundary embrittlement and composite interface fracture. Extended X-ray Absorption Fine Structure (EXAFS) analysis yields structural, as well as chemical information. The identity, coordination number, position and degree of disorder of atoms in the vicinity of interfaces and surfaces can be determined. Thus, EXAFS comparison of the imminent (latent) fracture surface to the fracture surface can yield structural, as well as chemical information about the fracture process. In this preliminary report, emphasis will be given to the application of Fracture-EXAFS to the study of interfaces in thin films. Discussion will also include the use of Fracture-EXAFS to study grain boundaries in polycrystalline materials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 188: Symposium K – Thin Films: Stresses and Mechanical Properties II , 1990 , 275
Copyright
Copyright © Materials Research Society 1990

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References

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