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Evolving Surface Cusps During Strained Layer Epitaxy
Published online by Cambridge University Press: 15 February 2011
Abstract
We have combined Z-contrast imaging and Ge marker layer experiments to study the evolving surface morphology of SixGel-x alloys grown by molecular beam epitaxy (MBE). Surface cusps are seen to arise as the intersection lines between coherent islands. The potential implications of stress concentrations associated with cusps are considered with a view to strain relaxation in the film via dislocation nucleation.
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- Copyright © Materials Research Society 1993
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