Hostname: page-component-788cddb947-jbkpb Total loading time: 0 Render date: 2024-10-15T09:18:49.658Z Has data issue: false hasContentIssue false

Detection of Near-Surface 52Cr Segregation in Irradiated 51V(Cr) By Rbs*

Published online by Cambridge University Press:  26 February 2011

L. E. Rehn
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
P. M. Baldo
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
Get access

Abstract

Irradiation at elevated temperatures of V(Cr) alloys is known to create a near-surface layer of nonequilibrium Cr enrichment. Highly reproducible RBS spectra were accumulated from a V-15%Cr alloy irradiated at 750°C, and from unirradiated portions of the same specimen. Differences between these spectra are used to demonstrate the high sensitivity of conventional RBS techniques for determining near-surface segregation behavior. Sensitivities obtained utilizing differences in the acquired spectra are much higher than those typically assumed for RBS measurements. Using 1.8 MeV 4He, and conventional RBS equipment and scattering geometries, segregation of < two atomic layers of 52Cr in 51V- 15at.%Cr over a depth of ∼5 nm has been observed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Footnotes

*

Work supported by the U. S. Department of Energy, BES-Materials Sciences, under Contract W-31-109-Eng-38.

References

REFERENCES

1. Rehn, L. E. and Okamoto, P. R. in Phase Stability During Irradiation, Nolfi, F. V. Jr., ed. (Applied Science, Essex, U.K., 1983) 247.Google Scholar
2. Backscattering Spectrometry, Chu, W-K, Mayer, J. W. and Nicolet, M-A. (Academic Press, New York, 1978).Google Scholar
3. Rehn, L. E., Averback, R. S. and Okamoto, P. R. in Advanced Techniques for Characterizing Microstructures, Wiffen, F. W. and Spitznagel, J. A., eds. (AIME, Warrendale, PA, 1982) p. 269.Google Scholar
4. Averback, R. S., Rehn, L E., Wagner, W., Wiedersich, H. and Okamoto, P. R., Phys. Rev. B28, 3100 (1983).Google Scholar
5. Wagner, W., Rehn, L. E., Wiedersich, H. and Naundorf, V., Phys. Rev. B28, 6780 (1983).CrossRefGoogle Scholar
6. Carlson, O. N., Eash, D. T. and Eustice, A. L. in Reactive Metals, Clough, W. R., ed. (Interscience Publishers, New York, 1959) 277.Google Scholar
7.PINTO was written by Benedek, R.; a description can be found in Averback, R. S., Benedek, R. and Merkle, K. L., Phys. Rev. B18, 4156 (1978).Google Scholar
8. Biersack, J. P. and Haggmark, L. G., Nucl. Inst. and Meth. B7/8, 257 (1980).CrossRefGoogle Scholar
9. Rehn, L. E., Okamoto, P. R., Potter, D. I. and Wiedersich, H., J. Nucl. Mater. 85 & 86, 763 (1979).Google Scholar
10. Ziegler, J. F., Lever, R. F. and Hirvonen, J. K. in Ion Beam Surface Layer Analysis, Meyer, O., Linker, G. and Koppeler, F., eds. (Plenum Press, New York, 1975) 163.Google Scholar
11. Rehn, L. E. and Baldo, P. M., to be published.Google Scholar