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A Cathodoluminescence Study of the Defects Created by the Degradation of High Power AlGaAs/GaAs Multiemitter Laser Bars

Published online by Cambridge University Press:  01 February 2011

Alonso Martín-Martín ,
Manuel Avella ,
M. Pilar Iñiguez ,
Juan Jiménez ,
Myriam Oudart  and
Julien Nagle
Alonso Martín-Martín
Affiliation:
[email protected], Universidad de Valladolid, Física de la Materia Condensada, Valladolid, Spain
Manuel Avella
Affiliation:
[email protected], Universidad de Valladolid, Física de la Materia Condensada, Valladolid, Spain
M. Pilar Iñiguez
Affiliation:
[email protected], Universidad de Valladolid, Física Teórica, Atómica y Óptica, Valladolid, Spain
Juan Jiménez
Affiliation:
[email protected], Universidad de Valladolid, Física de la Materia Condensada, Valladolid, Spain
Myriam Oudart
Affiliation:
[email protected], Alcatel-Thales, Palaiseau, France
Julien Nagle
Affiliation:
[email protected], Thales Research & Technology, Palaiseau, France
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Abstract

In this work we study the defects responsible for the degradation of high power AlGaAs based laser bars. The mirror and cavity degradations are studied by spectral cathodoluminescence (CL) imaging. Following the analysis of the CL images the main defects generated during the laser operation are revealed, both facet and intracavity defects are observed. A thermomechanical model is used to describe the very beginning of the defect formation. The defects are formed by a local plastic deformation induced by local heating at defects.

Keywords

luminescencedefectslaser
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1108: Symposium A – Performance and Reliability of Semiconductor Devices , 2008 , 1108-A06-04
Copyright
Copyright © Materials Research Society 2009

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References

REFERENCES

1. Neukum, J., Optics & Laser Europe 165, 37 (2008).Google Scholar
2. Quantum Well Laser Array Packaging, edited by J.W. Tomm and J. Jiménez (MacGraw-Hill, New York, 2006).Google Scholar
3. Welch, D. F., IEEE J. Selected Topics in Quantum Electron. 6, 1470 (2000).Google Scholar
4. Henry, C. H., Petroff, P. M., Logan, R. A. and Merritt, F. R., J. Appl. Phys. 50, 3721 (1979).Google Scholar
5. Tomm, J. W., Gerhard, A., Malyarchuk, V., Saint-Marie, Y., Galtier, P., Nagle, J. and Landesman, J. P., J. Appl. Phys. 93, 1354 (2003).Google Scholar
6. Andrianov, A. V., Dods, S. R. A., Morgan, J., Orton, J. W., Benson, T. M., Harrison, I., Larkins, E. C., Daiminger, F. X., Vassilakis, E. and Hirtz, J. P., J. Appl. Phys. 87, 3227 (2000).Google Scholar
7. Pommiès, M., Avella, M., Cánovas, E., Jiménez, J., Fillardet, T., Oudart, M. and Nagle, J.; Appl. Phys. Lett. 86, 131103 (2005).Google Scholar
8. Yu, H., Roberts, C., Murray, R.; Appl. Phys. Lett. 66, 2253 (1995).Google Scholar
9. Pommiés, M., Avella, M., Jiménez, J., Oudart, M. and Nagle, J.; Phys. Stat. Sol. (a) 202, 625 (2005).Google Scholar
10. Martín-Martín, A., Avella, M., Iñiguez, M. P., Jiménez, J., Oudart, M. and Nagle, J.; Appl. Phys. Lett. 93, 171106 (2008).Google Scholar
11. Landolt, M. and Börnstein, J., Numerical Data and Functional Relationships in Science and Technology, vol. 22/A of New Series, Group III , (Berlin: Springer, 1987) and REFERENCES therein.Google Scholar
12. Swaminathan, V. and Copley, S. M., J. Am. Ceram. Soc. 58, 482 (1975).Google Scholar
13. Suzuki, T., Yasutomi, T., Tokuoka, T. and Yonenaga, I., Phil. Mag. A 79, 2637 (1999).Google Scholar