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Atomic Scale Structure of Twin Boundary In Y-Ba-Cu-O Superconductors

Published online by Cambridge University Press:  25 February 2011

Yimei Zhu
Affiliation:
Department of Applied Science, Brookhaven National Laboratory, Upton, NY 11973
M. Suenaga
Affiliation:
Department of Applied Science, Brookhaven National Laboratory, Upton, NY 11973
Youwen Xu
Affiliation:
Department of Applied Science, Brookhaven National Laboratory, Upton, NY 11973
M. Kawasaki
Affiliation:
JEOL USA, Inc. Peabody, MA 01960
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Abstract

High resolution electron microscopy of the twin boundary layers in YBa2(Cu1-xMx)3O7–8 for x=0 and 0.02 and M=Zn, Fe and Al showed that the boundary widths are ∼1 nm for the pure and the Zn substituted YBa2Cu3O7, 2.5∼3 nm for the Fe and Al substituted oxide. It was found that the lattice plane is shifted across the twin boundary by (1/3 ∼ 1/2)·2d(110) along the boundary. The broadening of the layer for the cases of Fe and Al is also thought to be associated with a reduction of the twin boundary energy, which also leads to an increased twin density.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

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References

REFERENCES

1. Deutscher, G. and Muller, A. K., Phys. Rev. Lett. 59, 1745 (1987).Google Scholar
2. Daeumling, M., Seuntjens, J. and Larbalestier, D. C., Appl. Phys. Lett. 52, 590 (1988).Google Scholar
3. Matsushita, T., Funaki, K., Takeo, M. and Yamafuji, K., Jpn. J. Appl. Phys. 26, L1524 (1987).Google Scholar
4. Dolan, G. J., Chandrashekhar, G. V., Dinger, T. R., Field, C. and IHoltzberg, F., Phys. Rev. Lett. 62, 827 (1989).Google Scholar
5. Tu, K. N., Yeh, N. C., Park, S. I., and Tsuei, C. C., Phys. Rev. B. 39, 304 (1989).Google Scholar
6. Jon, C. J. and Washburn, J., J. Mater Res. 4, 795 (1989).Google Scholar
7. Zhu, Y., Suenaga, M., Xu, Y., Sabatini, R. L., and Moodenbaugh, A. R., Appl. Phys. Lett. 54, 374 (1989).Google Scholar
8. Zhu, Y., Suenaga, M., Sabatini, R. L., and Xu, Y., Proc. 47th Annual Meeting of Electron Microscopy Society of America, San Antonio, Aug. 1989 Bailey, G.W., ed., p.168, (1989).Google Scholar
9. Zhu, Y., Suenaga, M., and Xu, Y., Philos. Mag. Lett. 60, 51 (1989).Google Scholar
10. Xu, Y., Suenaga, M., Tafto, J., Sabatini, R. L., Moodenbaugh, A. R., and Zolliker, P., Phys. Rev. B 39 6667 (1989).Google Scholar
11. Gevers, R., Landuyt, J. Van, and Amelinckx, S., Phys. Status Solidi 11, 689 (1965).Google Scholar
12. Amelinckx, S. and Landuyt, J. Van, in Electron Microscopy in Mineralogy, Christie, J. M., Cowley, J. M., Hener, A. H., Thomas, G. and Tighe, N. J., editors, p.68 (1976).Google Scholar
13. Wordenweber, R., Sastry, G. V. S., Heinenmen, K., and Heryhardt, H. C., J. Appl. Phys. 65 1649 (1989).Google Scholar
14. Chandrasekar, N., Welch, D. O., and Suenaga, M., presented at 1988 Fall Meeting of the Materials Research Society, Boston, (1988).Google Scholar
15. Welch, D. O., unpublished and see Ref.10.Google Scholar
16. Bordet, P., Hodeau, J. L., Strobel, P., Marezio, M., and Santoro, A., Solid State Commun. 66, 435 (1988).Google Scholar
17. Hodeau, J. L., Bordet, P., Capponi, J. J., Chaillout, C., and Marezio, M., Physica C 153–155, 582 (1988).Google Scholar