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A TEM Study of the Microstructure Evolution of Cu(In,Ga)Se2 Films from Cu-Rich to In-Rich

Published online by Cambridge University Press:  21 March 2011

Y. Yan ,
K.M. Jones ,
J. AbuShama ,
M.M. Al-Jassim  and
R. Noufi
Y. Yan
Affiliation:
National Renewable Energy Laboratory, Golden, CO 80401
K.M. Jones
Affiliation:
National Renewable Energy Laboratory, Golden, CO 80401
J. AbuShama
Affiliation:
National Renewable Energy Laboratory, Golden, CO 80401
M.M. Al-Jassim
Affiliation:
National Renewable Energy Laboratory, Golden, CO 80401
R. Noufi
Affiliation:
National Renewable Energy Laboratory, Golden, CO 80401
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Abstract

The microstructure of Cu(In,Ga)Se2 (CIGS) films with compositions ranging from Cu-rich to In-rich was investigated by transmission electron microscopy (TEM) and energy-dispersive Xray spectroscopy (EDS). We found that the Cu-rich samples have larger grain sizes than the Inrich sample. In the Cu-rich samples, sub-interfaces were observed. The two sides of the subinterfaces were found to have different Cu concentration. In the In-rich sample, Ga inhomogeneity across grains was observed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 668: Symposium H – II-IV Compound Semiconductor Photovoltaic Materials , 2001 , H6.10
Copyright
Copyright © Materials Research Society 2001

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References

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