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Refractive Index Measurements of Barium Titanate From .4 to 5.0 Microns and Implications for Periodically Poled Frequency Conversion Devices

Published online by Cambridge University Press:  10 February 2011

David E. Zelmon ,
David L. Small  and
Peter Schunemann
David E. Zelmon
Affiliation:
Materials Directorate, Air Force Research Laboratory, Wright-Patterson AFB, OH 45433-7707
David L. Small
Affiliation:
Materials Directorate, Air Force Research Laboratory, Wright-Patterson AFB, OH 45433-7707
Peter Schunemann
Affiliation:
Sanders, A Lockheed-Martin Company, Nashua, NH 03061-0868
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Abstract

Barium titanate has recently been suggested as a possible candidate for use in periodically poled optical frequency conversion devices. We report refractive index measurements which are critical to periodically poled device designers and present quasi phase matching loci which can be used to design an optical parametric oscillator in periodically poled barium titanate

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 484: Symposium F – Infrared Applications of Semiconductors II , 1997 , 537
Copyright
Copyright © Materials Research Society 1998

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References

1. Armstrong, J. A., Bloembergen, N., Ducuing, J., , and Pershan, P. S., Phys. Rev., 127, p. 1918 (1962)Google Scholar
2. Fejer, M. M., Mangel, G. A., Jundt, D. H., and Byer, R. L., IEEE J. Quant. Elec., 28, p. 2631 (1992)Google Scholar
3. Myers, L. E. and Bosenberg, W. R., IEEE J. Quant. Elec., 33, p. 1663 (1997)Google Scholar
4. Webjom, J., Siala, S., Nam, D. W., Waarts, R. G., and Lang, R. J., IEEE J. Quant. Elec., 33, p. 1673 (1997)Google Scholar
5. Bosenberg, W. R., Drobshoff, A., Alexander, J.I., Myers, L.E., and Byer, R. L., Optics Lett., 21, p. 713 (1996)Google Scholar
6. Bortz, M. L., Arbore, M. A., and Fejer, M. M., Optics Lett., 20, p. 49 (1995)Google Scholar
7. Myers, L. E., Eckardt, R. C, Fejer, M. M., Byer, R. L., Bosenberg, W. R., and Pierce, J. W., J. Opt. Soc. Am. B, 12, p. 2102 (1995)Google Scholar
8. Myers, L. E., Eckardt, R. C, Fejer, M. M., Byer, R. L., and Bosenberg, W. R., Opt. Lett., 21, p. 591 (1996)Google Scholar
9. Myers, L. E., Miller, G. D., Eckardt, R. C., Fejer, M. M., Byer, R. L., and Bosenberg, W. R., Opt. Lett., 20, p. 52 (1995)Google Scholar
10. Balakrishnan, A., Sanders, S., DeMars, S., Webjörn, J., Nam, D. W., Lang, R. J., Mehuys, D. G., Waarts, R. G., and Welch, D. F., Opt. Lett., 21,952 (1996)Google Scholar
11. Yamada, M., Nada, N., Saitoh, M., and Watanabe, K., Appl. Phys. Lett., 62, p. 435 (1993)Google Scholar
12. Malitson, Irving, Appl. Opt., 2, 1103 (1963)Google Scholar
13. Born, Max and Wolf, Emil, Principles of Optics, 6th ed., Pergamon Press, 1980, p. 94 Google Scholar