Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-28T11:26:02.917Z Has data issue: false hasContentIssue false

Pioneering Development of Atomic Resolution In Situ Environmental Transmission Electron Microscopy for Probing Gas-Solid Reactions and In Situ Nanosynthesis

Published online by Cambridge University Press:  15 February 2011

Pratibha L. Gai*
Affiliation:
DuPont, Central Research and Development, Wilmington, DE 19880-0356, U.S.A. University of Delaware, Department of Materials Science, Newark, DE, U.S.A.
Edward D. Boyes
Affiliation:
DuPont, Central Research and Development, Wilmington, DE 19880-0356, U.S.A.
*
*Email address for correspondence: [email protected]
Get access

Abstract

Highlights of our pioneering development of atomic resolution in situ environmental transmission electron microscope (ETEM) for direct probing of gas-solid reactions and in situ nanosynthesis are described. Dynamic studies on supported nanoparticle catalysts and carbon nanotubes under different reaction environments have been carried out. The results provide deep insights into the dynamic nanostructure of the materials and their mode of operation.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Gai, P. L., Cat. Rev. Sci. Eng. 34, 1 (1992).Google Scholar
2. Gai, P. L. and Boyes, E. D., Electron Microscopy in Heterogeneous Catalysis, Institute of Physics Publ., Bristol, (2003).Google Scholar
3. Butler, E. P. and Hale, K. F., Dynamic Experiments, North Holland, Amsterdam, (1981).Google Scholar
4. Gai, P.L.: Topics in Catalysis. 9, 19 (1999).Google Scholar
5. Gai, P.L., Topics in Catalysis. 21, 161 (2002).Google Scholar
6. Thomas, J.M. and Gai, P.L., Advances in Catalysis. 48, 171 (2004).Google Scholar
7. Gai, P.L. et al. , Science. 267, 661 (1995).Google Scholar
8. Boyes, E.D. and Gai, P. L., Ultramicroscopy. 67, 219 (1997)Google Scholar
9. Gai, P.L., Acta.Cryst. B53, 346 (1997).Google Scholar
10. Boyes, E.D. and Gai, P.L., Microscopy Today. July 2004.Google Scholar
11. Haggin, J., American Chem.Soc. C&E News. 73 (30), 39, (1995).Google Scholar
12. Jacoby, M., American Chem.Soc. C&E News. 80(31), 26, (2002).Google Scholar
13. Gai, P.L., Microsc. Microan. 8, 21 (2002).Google Scholar
14. Gai, P.L., Curr.Opn. in Solid St.Mat.Sci. 4, 63, (1999) and 5, 371 (2001).Google Scholar
15. Gai, P. L., Lavin, G. and Boyes, E.D., Electron Microscopy; Inst.Physics ( IOP), 3, 501 (1998).Google Scholar