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Oxide Superconductor Interfaces Studied by Spectroscopic Ellipsometry

Published online by Cambridge University Press:  15 February 2011

B. J. Gibbons ,
S. Trolier-Mckinstry ,
D. G. Schlom  and
C. B. Eom
B. J. Gibbons
Affiliation:
Department of Materials Science and Engineering, Pennsylvania State University, University Park, PA 16802–5005, [email protected]
S. Trolier-Mckinstry
Affiliation:
Department of Materials Science and Engineering, Pennsylvania State University, University Park, PA 16802–5005, [email protected]
D. G. Schlom
Affiliation:
Department of Materials Science and Engineering, Pennsylvania State University, University Park, PA 16802–5005, [email protected]
C. B. Eom
Affiliation:
Department of Mechanical Engineering and Materials Science, Duke University, Durham, NC 27708, [email protected]
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Abstract

In the eight years since its discovery, numerous materials have been identified as being compatible with YBa2Cu3O7-δ (YBCO). Investigation of potentially compatible compounds requires a knowledge of both the chemistry and microstructure of the interface between the superconductor and the material. In this work, spectroscopic ellipsometry (SE) is being developed as a rapid and non-destructive characterization tool for investigating these interfaces. In addition, SE was used to determine reference optical data for common YBCO substrate materials. These include BaZrO3, 9.5 mol% Y2O3-ZrO2 (YSZ), NdGaO3 and LaSrGaO4.

SE measurements of epitaxial YBCO on YSZ substrates have shown that it is possible to identify the formation of the known BaZrO3 reaction layer. The modeled thickness of the reaction layer, as well as the modeled thickness of the YBCO film, are as expected. SE measurements as a function of temperature for YBCO/SrTiO3 have also been obtained. The SE data shows dramatic changes from room temperature to high temperature. This is due to the strong dependence of the dielectric function of YBCO on the oxygen content of the film.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 401: Symposium G – Epitaxial Oxide Thin Films II , 1995 , 333
Copyright
Copyright © Materials Research Society 1996

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