Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-28T15:30:56.249Z Has data issue: false hasContentIssue false

Nanoimprint Lithography of Light Trapping Structures in Sol-gel Coatings for Thin Film Silicon Solar Cells

Published online by Cambridge University Press:  01 February 2011

Maurits Heijna
Affiliation:
[email protected], ECN Solar Energy, thin film photovoltaics, P.O. Box 1, Petten, 1755 ZG, Netherlands, +31 224 564953
Jochen Loffler
Affiliation:
[email protected], ECN Solar Energy, P.O. Box 1, Petten, 1755 ZG, Netherlands
Bas Van Aken
Affiliation:
[email protected], ECN Solar Energy, P.O. Box 1, Petten, 1755 ZG, Netherlands
Wim Soppe
Affiliation:
[email protected], ECN Solar Energy, P.O. Box 1, Petten, 1755 ZG, Netherlands
Herman Borg
Affiliation:
[email protected], OM&T B.V., Glaslaan 2, Eindhoven, 5616 LW, Netherlands
Patrick Peeters
Affiliation:
[email protected], OM&T B.V., Glaslaan 2, Eindhoven, 5616 LW, Netherlands
Get access

Abstract

For thin-film silicon solar cells, light trapping schemes are of uppermost importance to harvest all available sunlight. Typically, superstrates with randomly textured TCO front layers are used to scatter the light diffusively in pin-cells on glass. Here, we investigate methods to texture opaque substrates with both random and periodic textures, for use in nip-cells on metal foil. We applied an electrically insulating SiOx-polymer coating on a stainless steel substrate, and textured this barrier layer by nanoimprint. On this barrier layer the back contact is deposited for further use in the solar cell stack. Replication of masters with various random and periodic sub-micron patterns was tested, and, using scanning electron microscopy, replicas were found to compare well with the originals. The embossing of the barrier layer does not diminish its electrically isolating properties, and thus adds extra functionality to this layer. Masters with U-grooves of various sub-micrometer widths have been used to investigate the optimal dimensions of regular patterns for light trapping in the silicon layers. Angular reflection distributions were measured to evaluate the light scattering properties of both periodic and random patterns. These periodic patterns, comprising diffraction gratings, show promising results in scattering the light to specific angles, enhancing the total internal reflection in the solar cell.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Maycock, P. and Bradford, T. PV Technology, Performance, and Cost, 2007 Update, (Prometheus Institute for Sustainable Development and PV Energy Systems, 2007).Google Scholar
2 Deckman, H.W. Roxlo, C.B. and Yablonovich, E. Opt. Lett. 8, 491 (1983).Google Scholar
3 Müller, J., Rech, B. Springer, J. and Vanecek, M. Solar Energy 77, 917 (2004).Google Scholar
4 Senoussaoui, N. Krausse, M. Müller, J., Bunte, E. Brammer, T. and Stiebig, H. Thin Solid Films 451-452, 397 (2004).Google Scholar
5 Eisele, C. Nebel, C.E. and Stutzmann, M. J. Appl. Phys. 89, 7722 (2001).Google Scholar
6 Gombert, A. Glaubitt, W. Rose, K. Dreibholz, J. Bläsi, B., Heinzel, A. Sporn, D. Döll, W. and Wittwer, V. Solar Energy 68, 357 (2000).Google Scholar
7 Brendel, R. Gier, A. Mennig, M. Schmidt, H. and Werner, J.H. J. Non-Cryst. Sol. 218, 391 (1997).10.1016/S0022-3093(97)00170-1Google Scholar
8 Löffler, J., Ballif, C. Brecl, K. Brooks, K. Finck, C. Fischer, D. Haug, F.-J., Mayerhofer, R. Soppe, W.J. Späth, M., Topic, M. and Wutz, M. presented at PVSEC 17, Fukuoka, Japan, 2007.Google Scholar