Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-12-01T07:18:37.841Z Has data issue: false hasContentIssue false
  • English
  • Français

Micron-Resolution Photocurrent of CdTe Solar Cells Using Multiple Wavelengths

Published online by Cambridge University Press:  21 March 2011

Jason F. Hiltner  and
James R. Sites
James R. Sites
Affiliation:
Department of Physics, Colorado State University, Fort Collins, CO 80523-1875
Get access

Abstract

An apparatus developed recently at Colorado State University utilizes a diffractionlimited optics system and a high-resolution translation system to measure the laser-induced photocurrent at resolutions of 1 μm and equivalent incident laser intensities of 1 sun (100 mW/cm2). Multiple lasers in the 635-830 nm range can be easily selected by changing the fiberoptic connectors. The spot profile and location are unchanged when different lasers are selected. In addition, a laser temperature tuned through the 825-857 nm range allows measurement of local variations in the quantum efficiency near the CdTe band gap, which track intermixing of CdS/CdTe. This capability extends the previous analysis, which includes the separation of series resistance and shunting effects. The effect of post-deposition processing and elevated temperature stress on local variations in electrical and optical parameters, especially using the near-bandgap wavelengths, are examined using a series of samples fabricated at NREL.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 668: Symposium H – II-IV Compound Semiconductor Photovoltaic Materials , 2001 , H9.8
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Hiltner, J.F. and Sites, J.R., Proc. of the 28th IEEE PVSC (2000).Google Scholar
2. Hiltner, J.F. and Sites, J.R., Proc. of the 16th European PVSEC (2000) p. 630.Google Scholar
3. Hiltner, J.F., PhD. Thesis, Colorado State University, 2001. available at www.colostate.edu/orgs/pvlab.Google Scholar
4. Levi, D. et al., Proc. of the 26th IEEE PVSC, 351 (1997).Google Scholar
5. Levi, D. et al., Proc. of the 2nd World PVSEC, 1047 (1998).Google Scholar
6. Dhere, R. et al., Proc. of the 26th IEEE PVSC (1997) p. 435.Google Scholar
7. Hill, R. and Richardson, D., Thin Solid Films 18, 25 (1973).Google Scholar
8. Hiltner, J.F. and Sites, J.R., AIP Conf. Series 462, 170 (1998).Google Scholar
9. Hegedus, S.S., McCandless, B.E., and Birkmire, R.W., Proc. of the 28th IEEE PVSC (2000).Google Scholar