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Metal‐Organic Decomposition and Microstructure Development in Ba2ycu3o7‐X Films from Metal Trifluoroacetate Precursors

Published online by Cambridge University Press:  28 February 2011

Paul C. Mcintyre
Affiliation:
Ceramics Processing Research Laboratory, Massachusetts Institute of Technology, Cambridge, MA.
Raymond C. Chiu
Affiliation:
Ceramics Processing Research Laboratory, Massachusetts Institute of Technology, Cambridge, MA.
Michael J. Cima
Affiliation:
Ceramics Processing Research Laboratory, Massachusetts Institute of Technology, Cambridge, MA.
Wendell E. Rhine
Affiliation:
Ceramics Processing Research Laboratory, Massachusetts Institute of Technology, Cambridge, MA.
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Abstract

Decomposition of metal‐organic precursors to Ba2Ycu3O7‐X films is difficult because of the high reaction temperature required to decompose the BaCO3 intermediate. The recently proposed use of metal trifluoroacetate (TFA) solutions offers an alternative path to barium‐containing superconducting films. The TFA salts decompose to the metal fluorides forming BaF2, eliminating BaCO3 from the system. Ultimate conversion to BYC, however, is shown not only to depend on hydrolysis of the BaF2 at high temperatures, but also hydrolysis of copper trifluoracetate at low temperatures to prevent the volatilization of Cu(TFA)2. These processes result in unique microstructural behavior which can be characterized by electon microscopy and Auger spectroscopy. Effects due to substrate interactions have been eliminated by use of a chemically inert substrate material, BaZrO3.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

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References

1 Parmigiani, F., Chiarello, G., Ripamonti, N., Goretzki, H., and Roli, U., Phys. Rev. B., 26, 71487150 (1987).Google Scholar
2 Gupta, A., Jagannathan, R., Cooper, E.I., Geiss, E.A., Landman, J.I., and Hussey, B.W., Appl. Phys. Lett., 52 (24), 20772079 (1988).Google Scholar
3 Burton, R.L., Segre, C.U., Marcy, H.O., and Kannewurf, C.R., submitted to SERI conference, Colorado Springs, Colorado, 1988.Google Scholar
4 Chan, S‐W., Hwang, D‐M., and Nazar, L., J. Appl. Phys., 65 (12), 47194722 (1989).Google Scholar
5 Cima, M.J., Schneider, J.S., and Peterson, S.C., Appl. Phys. Lett., 53 (8), 710712 (1988).Google Scholar