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In-situ TEM Study of Bismuth Nanostructures

Published online by Cambridge University Press:  01 February 2011

Xiaoting Jia ,
Vincent Berube ,
Shuo Chen ,
Bed Poudel ,
Son Hyungbin ,
Jing Kong ,
Yang Shao-Horn ,
Ren Zhifeng ,
Gang Chen  and
Mildred S Dresselhaus
Xiaoting Jia
Affiliation:
[email protected], MIT, Material Sciences and Engineering, 77 Massachusetts avenue room 13-3021, Cambridge, MA, 02139, United States
Vincent Berube
Affiliation:
[email protected], MIT, Physics, Cambridge, MA, 02139, United States
Shuo Chen
Affiliation:
[email protected], MIT, Mechanical Engineering, Cambridge, MA, 02139, United States
Bed Poudel
Affiliation:
[email protected], Boston College, Physics, Chestnut Hill, MA, 02467, United States
Son Hyungbin
Affiliation:
[email protected], MIT, Electrical Engineering and Computer Science, Cambridge, MA, 02139, United States
Jing Kong
Affiliation:
[email protected], MIT, Electrical Engineering and Computer Science, Cambridge, MA, 02139, United States
Yang Shao-Horn
Affiliation:
[email protected], MIT, Mechanical Engineering, Cambridge, MA, 02139, United States
Ren Zhifeng
Affiliation:
[email protected], Boston College, Physics, Chestnut Hill, MA, 02467, United States
Gang Chen
Affiliation:
[email protected], MIT, Mechanical Engineering, Cambridge, MA, 02139, United States
Mildred S Dresselhaus
Affiliation:
[email protected], MIT, Physics, Cambridge, MA, 02139, United States
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Abstract

Nanostructured thermoelectric materials have attracted lots of interest in recent years, due to their enhanced performance determined by their thermoelectric dimensionless figure of merit. However, because of equipment limitations, not much work has been done on combining simultaneous transport measurements and structural characterization on individual nanostructured thermoelectric materials. With an integrated TEM-STM system, we studied the structural behavior and electrical properties of bismuth (Bi) nanobelts and nanoparticles. Results showed that clean Bi nanostructures free of oxides can be produced by in-situ high temperature electro-migration and Joule annealing processes occurring within the electron microscope. Preliminary electrical measurements indicate a conductivity of two orders of magnitude lower for Bi nanoparticles than that for bulk Bi. Such in-situ studies are highly advantageous for studying the semimetal-semiconductor transition and how this transition could enhance thermoelectric properties.

Keywords

nanostructureBitransmission electron microscopy (TEM)
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1044: Symposium U – Thermoelectric Power Generation , 2007 , 1044-U03-04
Copyright
Copyright © Materials Research Society 2008

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