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Crystallographic and Metallurgical Characterization of Radiation Detector Grade Cadmium Telluride Materials

Published online by Cambridge University Press:  21 February 2011

C.J. Johnson ,
E.E. Eissler ,
S.E. Cameron ,
Y. Kong ,
S. Fan ,
S. Jovanovic  and
K.G. Lynn
C.J. Johnson
Affiliation:
eV PRODUCTS, div. of II-VI Incorporated, 375 Saxonburg Blvd., Saxonburg, PA 16056
E.E. Eissler
Affiliation:
Brookhaven National Laboratory, Department of Physics, Upton, NY 11973
S.E. Cameron
Affiliation:
eV PRODUCTS, div. of II-VI Incorporated, 375 Saxonburg Blvd., Saxonburg, PA 16056
Y. Kong
Affiliation:
Brookhaven National Laboratory, Department of Physics, Upton, NY 11973
S. Fan
Affiliation:
Brookhaven National Laboratory, Department of Physics, Upton, NY 11973
S. Jovanovic
Affiliation:
Brookhaven National Laboratory, Department of Physics, Upton, NY 11973
K.G. Lynn
Affiliation:
Brookhaven National Laboratory, Department of Physics, Upton, NY 11973
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Abstract

Radiation detector grade CdTe crystals are characterized by several crystallographic and metallurgical techniques including infrared microscopy, dislocation etch pitting and X-ray diffraction. Results are presented for 50 detectors fabricated from an ingot produced by the high pressure Bridgman method. Data on the temperature dependence of leakage current and pulse height analysis are presented, along with measurements of room temperature charge transport properties. Attempts to relate crystal structure to detector performance will be discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 302: Symposium F – Semiconductors for Room-Temperature Radiation Detector Applications , 1993 , 463
Copyright
Copyright © Materials Research Society 1993

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References

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