Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-28T13:43:13.276Z Has data issue: false hasContentIssue false
  • English
  • Français

Crystal Structures and Thermoelectric Properties of Ru1-xRexSiy Chimney-Ladder Compounds

Published online by Cambridge University Press:  26 February 2011

Akira Ishida ,
Norihiko L. Okamoto ,
Kyosuke Kishida ,
Katsushi Tanaka  and
Haruyuki Inui
Akira Ishida
Affiliation:
[email protected], Kyoto University, Department of Materials Science and Engineering, Sakyo-ku, Kyoto, 606-8501, Japan, +81-75-753-5473, +81-75-753-5461
Norihiko L. Okamoto
Affiliation:
[email protected], Kyoto University, Department of Materials Science and Engineering, Sakyo-ku, Kyoto, 606-8501, Japan
Kyosuke Kishida
Affiliation:
[email protected], Kyoto University, Department of Materials Science and Engineering, Sakyo-ku, Kyoto, 606-8501, Japan
Katsushi Tanaka
Affiliation:
[email protected], Kyoto University, Department of Materials Science and Engineering, Sakyo-ku, Kyoto, 606-8501, Japan
Haruyuki Inui
Affiliation:
[email protected], Kyoto University, Department of Materials Science and Engineering, Sakyo-ku, Kyoto, 606-8501, Japan
Get access

Abstract

The phase relationship of Re-alloyed Ru2Si3 and the variations of the crystal structures and thermoelectric properties of the Ru1-xRexSiy chimney-ladder phases have been studied as a function of the Re concentration. The Ru1-xRexSiy chimney-ladder phases are formed in a wide compositional range. Compositional formula of the chimney-ladder phases are determined to be Ru1-xRexSi1.5386+0.1783x (0.14 ≤ x ≤ 0.76), which are systematically deviated from the idealized composition conforming the valence electron counting rule: VEC=14. Measurements of thermoelectric properties of single crystals with different compositions reveals that the chimney-ladder phases exhibit n-type semiconducting behavior at low Re concentrations and p-type semiconducting behavior at high Re concentrations. These results suggests that the VEC=14 rule can be used for predicting the semiconducting behavior of the chimney-ladder phases through the adjustment of VEC values by substituting elements, producing p-type semiconductors for VEC<14 and n-type for VEC>14, with the carrier concentration related to the deviation from VEC=14.

Keywords

crystallographic structurethermoelectricitytransmission electron microscopy (TEM)
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 980: Symposium II – Advanced Intermetallic-Based Alloys , 2006 , 0980-II05-37
Copyright
Copyright © Materials Research Society 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Vining, C. B., AIP Conf. Proc. 246, 338 (1992).Google Scholar
2. Arita, Y., Mitsuda, S., Nishi, Y., Matsui, T., and Nagasaki, T., J. Nucl. Mat. 294, 202 (2001).Google Scholar
3. Ivanenko, L., Filonov, A., Shaposhnikov, V., Behr, G., Souptel, D., Schumann, J., Vinzelberg, H., Plotnikov, A., and Borisenko, V., Microelectronic Eng. 70, 209 (2003).Google Scholar
4. Simkin, B. A., Hayashi, Y., and Inui, H., Intermetallics 13, 1225, (2005).Google Scholar
5. Simkin, B. A., Ishida, A., Okamoto, N. L., Kishida, K., Tanaka, K., and Inui, H., Acta Mater. 54, 2857 (2006).Google Scholar
6. Jeitschko, W. and Parthé, E., Acta Cryst. 22, 417, (1967).Google Scholar
7. Nowotny, H., in The Chemistry of Extended Defects in Non-Metallic Solids, edited by Eyring, E. R., O'Keefe, M. (North-Holland, Amsterdam, 1970), p.223.Google Scholar
8. Pearson, W. B., Acta Cryst. B 26, 1044 (1970).Google Scholar
9. Fredrickson, D. C., Lee, S., Hoffmann, R., and Lin, J., Inorg. Chem. 43, 6151 (2004).Google Scholar
10. Fredrickson, D. C., Lee, S., Hoffmann, R., Inorg. Chem. 43, 6159 (2004).Google Scholar
11. Ye, H. Q. and Amelinckx, S., J. Solid State Chem. 61, 8 (1986).Google Scholar
12. Imai, Y. and Watanabe, A., Intermetallics 13, 233 (2005).Google Scholar
13. Susz, C. P., Muller, J., Yvon, K., Parthé, E., J. Less-Common Met. 71, P1 (1980).Google Scholar