Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-28T10:53:49.643Z Has data issue: false hasContentIssue false

Carbon Nanotubes as Potential Cold Cathodes for Vacuum Microelectronic Applications

Published online by Cambridge University Press:  01 February 2011

Sanju Gupta*
Affiliation:
[email protected], University of Missouri-Columbia, Electrical and Computer Engineering, 6th St. 303 EBW, Columbia, MO, 65211-2300, United States, 57388200948, 5738820397
Get access

Abstract

Materials science is playing a dramatic role in discovering new materials with tailored physical properties. Cold cathodes/field emitters are one of the examples. Electron field emitting materials are of vital importance for a variety of vacuum microelectronic devices including field emission displays for flat panel displays, electron microscopes, X-ray generators, and vacuum lamps. This is the driving force to investigate the advanced nanostructured carbons as cold cathodes as one of the potential candidates. Recently, they are also being proposed for thermionic power generators. The rationale is that reducing one or more dimensions of a system below some critical length changes the systems' physical properties, where carbon nanotubes (CNTs) in the class of carbon nanostructures serve as a model example. In this paper, synthesis and characterization of vertically aligned multiwall and single-/double-wall carbon nanotube films using a microwave plasma-assisted chemical vapor deposition technique for vacuum microelectronics is presented. Recent advances in their synthesis, processing, and characterization indicate that the above mentioned potential is slowly being realized. Experiments showed that by continuous reduction in the thickness of the catalyst film produces hollow concentric tubes in contrast to bamboo-like multiwalled tubes with larger thickness. To assess the electron field emission properties, besides the traditional field emission (I-V) properties, temperature dependent field electron emission microscopy (T-FEEM) enabling real-time imaging of electron emission providing information on emission site density, temporal variation of the emission intensity, and insight into the role of adsorbates from nanotube films will be discussed. Physics based models (such as negative or low electron affinity, geometric enhancement, surface dipole, tunneling due to adsorbates, structure modification due to doping etc.) will be described to support the experimental observations in addition to weak thermionic field emission contribution. These findings provided a great insight into the field emission mechanism and a contrasting comparison between small and large diameter carbon nanotubes.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Kroto, H. W., Heath, J. R., B'Brien, S. C., Curl, R. F., and Smalley, R. E., Nature 318, 162 (1985); W.Krätschmer, L. D. Lamb, K. Fostiropoulos, and D. R. Huffman, Nature 347, 354 (1990).Google Scholar
2. Curl, R. F. and Smalley, R. E., Sci. Amer. 265, 32 (1991).Google Scholar
3. Iijima, S., Nature 354, 56 (1991).Google Scholar
4. Sattler, K., Carbon 33, 915 (1995).Google Scholar
5. Charlier, J.-C. and Rignanese, G.-M., Phys. Rev. Lett. 86, 5970 (2001).Google Scholar
6. Krishnan, A., Dujardin, E., Treacy, M. M. J., Hugdahl, J., Lynum, S., and Ebbesen, T. W., Nature 388, 451 (1997); T. W. Ebbesen, Acc. Chem. Res. 31, 558 (1998).Google Scholar
7. Martel, R., Shea, H. R., and Avouris, P., Nature 398, 299 (1999).Google Scholar
8. Sano, M., Kamino, A., Okamura, J., and Shinkai, S., Science 293, 1299 (2001).Google Scholar
9. Oh, D.-H., Park, J. M., and Kim, K. S., Phys. Rev. B 62, 1600 (2000).10.1103/PhysRevB.62.1600Google Scholar
10. Wang, Y. Y., Gupta, S., and Nemanich, R. J., Appl. Phys. Lett. 85, 2601 (2004).Google Scholar
11. Choi, W. B., Chung, D. S., Kang, J. H., Kim, H. Y., Jin, Y. W., Han, I. T., Lee, Y. H., Jung, J. E., Lee, N. S., Park, G. S., and Kim, J. M., Appl. Phys. Lett. 75, 3129 (1999).Google Scholar
12. Gröning, O., Kuttel, O. M., Emmenegger, Ch., Gröning, P., Schlapbach, L., J. Vac. Sci. Technol. B 18, 665 (2000).Google Scholar
13. Kock, F. A. M., Garguillo, J. M., Nemanich, R. J., Gupta, S., Weiner, B. R., and Morell, G.,Diam. And Relat. Mater. 12, 474 (2003).10.1016/S0925-9635(02)00365-5Google Scholar
14. Shih, S. H., Fisher, T. S., Walker, D. G., Strauss, A. M., Kang, W. P., and Davidson, J. L., J. Vac. Sci. Technol. B 21, 587 (2003).Google Scholar
15. Wang, Y. Y., Kock, F. A. M., Garguilo, J. M., and Nemanich, R. J., Diam. and Relat. Mater. 13, 457 (2004).Google Scholar
16. Nemanich, R. J., English, S. L., Hartman, J. D., Sowers, A. T., ward, B. L., Ade, H., and Davis, R. F., Appl. Surf. Sci. 146, 287 (1999).Google Scholar
17. Bonard, J.-M., Weiss, N., Kind, H., Stöckli, T., Forró, L., Kern, K., and Chatelain, A., Adv.Mater. 13, 184 (2000).Google Scholar
18. Wang, Y. Y., Gupta, S., Liang, M. L., and Nemanich, R. J., J. Appl. Phys. 97, xx (2005).Google Scholar
19. de Heer, W. A., Chatelain, A., Ugarte, D., Science, 270, 1179 (1995); Chung, D. S., Choi, W. B., Kang, J. H., Kim, H. Y., Han, I. T., Park, Y. S., Lee, Y. H., Lee, N. S., Jung, J. E., Kim, J. M., J. Vac. Sci. Technol. B 18, 1054 (2000).Google Scholar
20. Collazo, R., Schlesser, R., and Sitar, Z., Diam. and Relat. Mater. 11, 769 (2002); K. A. Dean and B. R. Chalamala, Appl. Phys. Lett. 76, 375 (2000).Google Scholar