Hostname: page-component-cd9895bd7-7cvxr Total loading time: 0 Render date: 2024-12-27T10:29:59.505Z Has data issue: false hasContentIssue false
  • English
  • Français

Distributed Bragg Reflectors for Vertical-Cavity Surface-Emitting Lasers

Published online by Cambridge University Press:  31 January 2011

W.G. Breiland ,
A.A. Allerman ,
J.F. Klem  and
K.E. Waldrip
Get access

Abstract

Distributed Bragg reflectors (DBRs) not only serve as high-reflectance mirrors to define the laser cavity of a vertical-cavity surface-emitting laser (VCSEL), but they also must conduct electricity, confine currents, and provide a single-crystal template for the gain region of the laser. Basic optical and electrical properties of DBRs are presented in this article. Three examples of DBR structures used in VCSEL applications from the ultraviolet to the infrared are given to illustrate the complexity and range of materials science issues that are encountered in DBR growth. Fabrication issues are also discussed.

Keywords

chemical vapor deposition (CVD)compound semiconductorsoptoelectronic materialsvertical-cavity surface-emitting lasers (VCSELs).
Type
Research Article
Information
MRS Bulletin , Volume 27 , Issue 7: Vertical-Cavity Surface-Emitting Lasers , July 2002 , pp. 520 - 524
Copyright
Copyright © Materials Research Society 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.MacLeod, H.A., Thin-Film Optical Filters, 2nd ed. (McGraw-Hill, New York, 1989) p. 164.Google Scholar
2.Weber, J., Malloy, K., and Wang, S., IEEE Photon. Technol. Lett. 2 (1990) p. 162.CrossRefGoogle Scholar
3.Lear, K.L. and Schneider, R.P. Jr, Appl. Phys. Lett. 68 (1996) p. 605.CrossRefGoogle Scholar
4.Choquette, K.D., Schneider, R.P. Jr., Lear, K.L., and Geib, K.M., Electron. Lett. 30 (1994) p. 2043.CrossRefGoogle Scholar
5.Breiland, W.G. and Killeen, K.P., J. Appl. Phys. 78 (1995) p. 6726.CrossRefGoogle Scholar
6.Hou, H.Q., Choquette, K.D., Hammons, B.E., Breiland, W.G., Crawford, M.H., and Lear, K.L., in Proc. SPIE, Vol. 3003 (SPIE—The International Society for Optical Engineering, Belling-ham, WA, 1997) p. 34.Google Scholar
7.Choquette, K.D., Klem, J.F., Fischer, A.J., Blum, O., Allerman, A.A., Fritz, I.J., Kurtz, S.R., Breiland, W.G., Sieg, R., Geib, K.M., Scott, J.W., and Naone, R.L., Electron. Lett. 36 (2000) p. 1388.CrossRefGoogle Scholar
8.Hearne, S., Chason, E., Han, J., Floro, J.A., Figiel, J., Hunter, J., Amano, H., and Tsong, I.S.T., Appl. Phys. Lett. 74 (1999) p. 356.CrossRefGoogle Scholar