Hostname: page-component-cd9895bd7-8ctnn Total loading time: 0 Render date: 2024-12-23T05:17:36.704Z Has data issue: false hasContentIssue false
  • English
  • Français

A Scanning Probe Microscope in My Scanning Electron Microscope?

Published online by Cambridge University Press:  14 March 2018

George J. Collins
George J. Collins*
Affiliation:
Huddee Ho, TopoMetrix

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Scanning probe microscopes (SPMs) designed to fit into scanning elec- tron microscopes (SEMs) are now becoming commercially available and you might ask, "Why would I want to put an SPM in my SEM"? The primary reason is that the too forms of microscope are very complimentary. Each microscope extends the power of the other. The SEM can do things that are hard to do with an SPM, and vice versa.

Not long after the introduction of the STM and the AFM, a few re- searchers built custom SPMs and installed them in their SEMs. The reports of these projects to build hybrid microscopes and examples of the data they produced can be found in the scientific literature.

Type
Research Article
Information
Microscopy Today , Volume 3 , Issue 2 , March 1995 , pp. 22 - 23
Copyright
Copyright © Microscopy Society of America 1995

References

1. Binnig, G., Rohrer, H., Gerber, Ch., and Weibel, E., Phys. Rev. Lett. 49, 57 (1982)CrossRefGoogle Scholar
2. Binnig, G., Quate, C. F. and Gerber, Ch., Phys. Rev. Lett. 56, 930 (1986)Google Scholar
3. Rosolen, G. and Welland, M., Rev. Sci. Instrum. 63, 9 (1992)CrossRefGoogle Scholar
4. Gerber, Ch., Binnig, G., Fuchs, H., Marti, O. and Rohrer, H., Rev. Sci. Instrum. 57, 221 (1986)Google Scholar